• Automatic bad‐pixel mask maker for X‐ray pixel detectors with application to serial crystallography 

      Sadri, Alireza; Hadian-Jazi, Marjan; Yefanov, Oleksandr; Galchenkova, Marina; Kirkwood, Henry; Mills, Grant; Sikorski, Marcin; Letrun, Romain; de Wijn, Raphael; Vakili, Mohammad; Oberthuer, Dominik; Komadina, Dana; Brehm, Wolfgang; Mancuso, Adrian P.; Carnis, Jerome; Gelisio, Luca; Chapman, Henry N. (Journal of Applied Crystallography, 2022-11-21)
      X‐ray crystallography has witnessed a massive development over the past decade, driven by large increases in the intensity and brightness of X‐ray sources and enabled by employing high‐frame‐rate X‐ray detectors. The ...
    • Data reduction for X‐ray serial crystallography using machine learning 

      Rahmani, Vahid; Nawaz, Shah; Pennicard, David; Setty, Shabarish Pala Ramakantha; Graafsma, Heinz (Journal of Applied Crystallography, 2023-01-24)
      Serial crystallography experiments produce massive amounts of experimental data. Yet in spite of these large‐scale data sets, only a small percentage of the data are useful for downstream analysis. Thus, it is essential ...
    • XGANDALF – extended gradient descent algorithm for lattice finding 

      Gevorkov, Yaroslav; Yefanov, Oleksandr; Barty, Anton; White, Thomas A.; Mariani, Valerio; Brehm, Wolfgang; Tolstikova, Aleksandra; Grigat, Rolf-Rainer; Chapman, Henry N. (Acta Crystallographica Section A, 2019-08-30)
      Serial crystallography records still diffraction patterns from single, randomly oriented crystals, then merges data from hundreds or thousands of them to form a complete data set. To process the data, the diffraction ...